Characterization of histological changes at the tillering stage (Z21) in resistant and susceptible wheat plants infected by Tilletia controversa Kühn

Table 1 Analysis of damaged critical corresponding cells in roots, stems, and leaves at the seedling growth stage (Z13) and tillering stage (Z21) in infected both wheat cultivars determined by scanning electron microscopy and transmission electron microscopy

Treatments	Total cells		Damaged cells		Rate of damaged cells (%)		P-value
Treatments	Z13	Z21	Z13	Z21	Z13	Z21	P-value
Scanning electron microscopy
S1-root	317	263	98	149	32.48 ± 9.55	56.85 ± 3.22	0.0031 *
S2-root	207	367	39	161	19.42 ± 2.55	44.58 ± 4.48	0.008 *
R1-root	394	390	47	41	11.74 ± 1.69	10.51 ± 0.52	0.5258
R2-root	319	377	23	29	7.34 ± 1.57	8.24 ± 3.34	0.819
S1-stem	102	184	24	62	23.50 ± 3.26	33.07 ± 2.08	0.0097 *
S2-stem	126	154	22	48	17.30 ± 1.49	31.06 ± 2.80	0.012 *
R1-stem	164	131	22	16	12.16 ± 3.63	11.91 ± 3.38	0.9617
R2-stem	101	106	7	6	7.37 ± 0.10	5.86 ± 1.73	0.488
S1-leaf	120	115	18	47	15.16 ± 1.14	41.21 ± 4.57	0.004 *
S2-leaf	107	126	38	60	37.14 ± 6.33	47.71 ± 1.27	0.177
R1-leaf	108	112	12	11	12.05 ± 3.28	10.50 ± 2.13	0.7102
R2-leaf	109	118	6	12	5.39 ± 0.09	10.12 ± 0.63	0.012
Transmission electron microscopy
S1-root	45	137	17	59	36.36 ± 2.56	44.45 ± 5.91	0.0277 *
S2-root	21	37	7	13	30.45 ± 3.66	37.92 ± 4.10	0.246
R1-root	114	123	13	12	11.49 ± 0.71	9.95 ± 1.99	0.5073
R2-root	70	28	8	7	13.10 ± 2.10	26.33 ± 1.86	0.009 *
S1-stem	42	44	8	17	19.57 ± 2.20	39.88 ± 3.42	0.0075 *
S2-stem	27	23	5	6	19.53 ± 2.97	29.75 ± 4.49	0.130
R1-stem	56	58	4	9	7.11 ± 1.08	14.97 ± 1.54	0.14
R2-stem	41	44	6	7	14.11 ± 0.87	16.41 ± 1.01	0.160
S1-leaf	56	31	8	10	15.79 ± 3.88	34.81 ± 3.55	0.0224 *
S2-leaf	43	26	6	9	13.14 ± 0.43	38.79 ± 10.96	0.080
R1-leaf	50	34	3	3	7.04 ± 1.03	8.09 ± 1.97	0.6615
R2-leaf	74	25	5	4	7.93 ± 1.59	15.19 ± 2.28	0.059

Each entry in the table indicates the average cells, with total cells based on 100 ~ 400 critical corresponding cells by scanning electron microscopy and 4 ~ 120 critical corresponding cells by transmission electron microscopy. The percentages of damaged critical corresponding cells = the number of damaged critical corresponding cells/the total number of observed critical corresponding cells × 100%. The significant P-values were indicated as “*” for a significance level of 0.05 according to ANOVA (Duncan’s multiple range test). S-root indicates root cells in the susceptible wheat cultivar, R-root indicates root cells in the resistant wheat cultivar, S-stem indicates stem cells in the susceptible wheat cultivar, R-stem indicates stem cells in the resistant wheat cultivar, S-leaf indicates leaf cells in the susceptible wheat cultivar, and R-leaf indicates leaf cells in the resistant wheat cultivar. S1, S2, R1, and R2 are CU42, Dongxuan 3, Mianyang 26/Yumai 47, and Yinong 18/Lankao 8, respectively

ISSN: 1471-2229